Skip to main content

Table 3 Reliability coefficients obtained through the test-retest method

From: Pieces of evidences of reliability of the Brazilian version of the Child Executive Functions Battery (CEF-B)

EF Test Variable N Test Retest t rxx
M SD M SD
Inhibition Stroop Time 28 92.9 54.3 67.7 55.7 1.94 .53
Error 3.1 3.7 1.7 2.9 1.86 .50
Tapping Go/No-Go Time 31 6.7 11.3 3.1 8.1 1.54 .18
Go/No-Go Error 1.3 2.0 0.8 1.1 1.30 .43
Conflict Time 22.2 13.4 24.2 30.2 − .02 .44
Conflict Error 2.4 2.8 1.9 2.0 1.31 .43
Working memory Dual task Evolution digit span 31 101.1 54.4 99.2 36.3 .58 .57
Evolution clowns 96.1 13.2 102.1 13.8 1.73 .23
Mu Score 98.6 30.2 100.7 19 − .04 .56
Flexibility TMT Flexibility index 28 38.4 41.9 41.4 54 1.42 .27
KCST Time 30 227.9 68,2 214,8 75.9 .76 .60
Categories 2.9 1.2 3.6 1.6 − 2.37 .59
Perseverations 7.5 4.8 5.5 4.3 2.71 .75
Frog test Time 30 262.8 88 216 63.7 2.97 .43
Score 52.6 9.8 55.7 9.7 − 2.53 .70
  1. Note. M Mean, SD Standard deviation, rxx reliability coefficient